Effects of Fermi pinning and quantum mechanisms on leakage current of 4H-SiC Schottky diodes

نویسندگان

چکیده

Reverse bias leakage current through 4H-SiC Schottky diodes was modeled using quantum transmission theory and the theoretically calculated values were compared with measured from fabricated diodes. To account for interface defects, energy barriers due to Fermi pinning previously observed defects used in place of ideal barrier structure predicted by Schottky–Mott rule. Incorporating set at known defect energies resulted better experimental agreement many orders magnitude.

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ژورنال

عنوان ژورنال: Journal of Applied Physics

سال: 2022

ISSN: ['1089-7550', '0021-8979', '1520-8850']

DOI: https://doi.org/10.1063/5.0068371